Relative calibration mode for compositional depth profiling in GD-OES
- Creator: Nelis, Thomas , Aeberhard, Max , Payling, Richard , Michler, Johann , Chapon, Patrick
- Resource Type: journal article
- Date: 2004
Rf-GDOES depth profiling analysis of a monolayer of thiourea adsorbed on copper
- Creator: Shimizu, K. , Payling, R. , Habazaki, H. , Skeldon, P. , Thompson, G. E.
- Resource Type: journal article
- Date: 2004